Applications – Layer Thickness Si
Applications – Layer Thickness Si
Applications – Layer Thickness Si
Layer Thickness Si
Measuring instrument StraDex f is suitable for this.
The measurement instrument evaluates silicon thickness of a wafer (all over), generates full wafer maps and calculates the Total Thickness Variation of the wafer.
StraDex f can be used for Silicon Carbide, Sapphire, Gallium Arsenide as well as Glass.
CONTACT
sentronics metrology GmbH
Dudenstr. 27-35
68167 Mannheim
Fon: +49 621 84251-0
Fax: +49 621 84251-200
info@sentronics-metrology.de
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