Applications – Layer Thickness Si

Applications – Layer Thickness Si

Applications – Layer Thickness Si

Layer Thickness Si

Measuring instrument StraDex f is suitable for this.

The measurement instrument evaluates silicon thickness of a wafer (all over), generates full wafer maps and calculates the Total Thickness Variation of the wafer.

StraDex f can be used for Silicon Carbide, Sapphire, Gallium Arsenide as well as Glass.

© Copyright 2020 - sentronics metrology GmbH