CONTACT
sentronics metrology GmbH
Dudenstr. 27-35
68167 Mannheim
Fon: +49 621 84251-0
Fax: +49 621 84251-200
info@sentronics-metrology.de
Key points
Measuring instrument StraDex a is suitable for this.
The measurement instrument evaluates the surface roughness down to sub nanometer, applies filters according to ISO standards and calculates surface parameters according to ISO 4287, 13565 or 25178.