Applications – Thin Film
Applications – Thin Film
Applications – Thin Film
Thin Film of Passivation or Photoresist Layer
Measuring instrument StraDex t is suitable for this.
The measurement instrument evaluates the thickness of up to 4 thin layer down to 5 nm either on test windows of a product wafer or all over blanked wafer. On blanked wafer it generates full wafer maps and calculates the Total Thickness Variation of thin layers.