Applications – Thin Film

Applications – Thin Film

Applications – Thin Film

Thin Film of Passivation or Photoresist Layer

Measuring instrument StraDex t is suitable for this.

The measurement instrument evaluates the thickness of up to 4 thin layer down to 5 nm either on test windows of a product wafer or all over blanked wafer. On blanked wafer it generates full wafer maps and calculates the Total Thickness Variation of thin layers.

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